Process capability: Cp and Cpk
Indices comparing the specification width with the process's natural spread (Cp) and accounting for how well the process is centred (Cpk).
- upper and lower specification limits (customer requirements)
- process mean (grand mean of the data)
- within-subgroup sd: (default), , or for individual values
- overall sample standard deviation of all values ()
When to use
- After a process has been shown to be in statistical control, to judge whether it can meet specifications.
Assumptions
- The process is stable (in control) — otherwise no single σ describes it.
- Approximately normal data: the "6σ covers almost everything" logic relies on it.
- With one specification limit only the one-sided index (CPU or CPL) exists, and Cpk is that index.
How to interpret
- Cp ≥ 1.33 is a common minimum; Cp = 1 means the specification width equals 6σ.
- Cpk ≤ Cp always; Cpk much smaller than Cp means the process is off-centre — recentring could help without reducing variation.
- Pp/Ppk use the overall spread; a big gap from Cp/Cpk points to drift between subgroups.
Common mistakes
- Computing indices for an unstable process.
- Treating a point estimate from 20 values as precise — capability indices have wide sampling variability.
- Mixing up specification limits and control limits.
Example
The 20 measurements of the X̄–R example (mean 10.035, ), specifications 9.4 to 10.8: ; . Not capable by the 1.33 standard, and slightly closer to the lower limit. Here gives , — with so few subgroups the two σ estimates differ by chance.